Scanning Probes

Xspect New Renishaw

Scanning probes for your CMM

Renishaw's range of scanning probes are all passive sensors, featuring lightweight mechanisms and isolated optical metrology systems for fast and accurate scanning.

Scanning probes are miniature measuring machines that can acquire several hundred surface points each second. Your CMM software can use this data to provide you with information about the form of the features that you measure, as well as their size and position. Scanning probes can also be used to acquire discrete points in a similar way to touch-trigger probes.

Renishaw scanning probes feature innovative, lightweight passive mechanisms (no motors or locking mechanisms) that exhibit a high natural frequency, making them suitable for high speed scanning. Isolated optical metrology systems measure the deflection of the stylus directly (not via stacked axes within the probe mechanism) for better accuracy and faster dynamic response. A range of solutions are available, suitable for all sizes and configurations of CMM.

Additional Renishaw information on the SP25M scanning probe system and SP80 ultra-high accuracy scanning probe can be downloaded by clicking either link. Format is Microsoft Word.

Voice: 248.295.4300
Toll Free: 866.4.Xspect (866.497.7328)
Fax: 248.295.4301
inquiries@xspectsolutions.com

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Xspect Solutions, Inc.
Wenzel Building
47000 Liberty Drive
Wixom, MI 48393

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Motorized Probes
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Scanning Probes
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Additional information on the Renisahaw SP25M scanning probe system and SP80 ultra-high accuracy scanning probe can be downloaded by clicking either link. Format is Microsoft Word.